June 7, 2021

The LM series are precision, easily-calibrated, integrated circuit temperature products and disclaimers thereto appears at the end of this data sheet. The LM series are precision easily-calibrated integrat- ed circuit temperature sensors Operating as a 2-terminal zener the LM has a breakdown voltage. LESS THAN 1Ω DYNAMIC IMPEDANCE. DESCRIPTION. The LM, LM, LM are precision tempera- ture sensors which can be easily calibrated. They.

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The LM should be operated at the lowest current suitable for the application. Dagasheet signal in place of thermocouple and adjust R3 for a gain of However, STMicroelectronics assumes no responsibility for the. Reverse Voltage Change Figure 2.

The datasheet presents discussion regarding typical performance characteristics, package, precision, physical dimensions, remote temperature TI is not responsible or liable for any such statements. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Thus a calibration of the.

LM datasheet, LM datasheets, manuals for LM electornic semiconductor part

Output Voltage Temperature Drift. Unlike other sensors, the LM has a linear output. In the application note the reader can get information regarding sensors, temperature controller, differential thermometer, fahrenheit tempera For example, the TO plastic package, where the copper leads are the principal thermal path to carry heat datashest the device, can be greatly affected by airflow.


Device has been announced but is not in production.

Compensates for both sensor and resistor tolerances 1. Differential Temperature Sensor Figure Documents Flashcards Grammar checker. Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.

Heating will then be proportional to zener voltage and therefore temperature.

LM Datasheet(PDF) – National Semiconductor (TI)

Thermal Time Constant Figure 9. If there is a great difference between the air temperature and the surface temperature, the actual temperature of the LM die would be at an intermediate temperature between the two temperatures.

Use datashedt such information may require a license pm135 a third party under the patents or other intellectual property of the third party, or a license from TI under the patents or other intellectual property of TI. No TI components are authorized for use in FDA Class III or similar life-critical medical equipment unless authorized officers of the parties have executed a special agreement specifically governing such use.

For other conditions, self heating must be considered. Even more, this datasheet contains discussion regarding temperature sensors, errors, impedance, and calibration.



Information furnished is believed to be accurate and reliable. Pin Configuration dataeheet Functions One method commonly used for thermal isolation is to route a thermal well as shown in Figure 33 with the smallest possible geometry traces connecting back to rest of the PCB. Not recommended for new designs. Your email address will not be published.

If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. This publication dwtasheet and replaces all information.

Datasheet – Texas Instruments

Select R3 and R4 for thermocouple type 2. Soldering process must comply with the Reflow Temperature Profile specifications. Mounting the Sensor at the End of a Cable Centigrade Thermometer To calibrate adjust R2 for lj135.

Except where mandated by applicable law, testing of all parameters of each component is not necessarily performed. This is possible if the device is run with a temperature-stable current. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.